Professional path:

• Engineering office for technical mathematics - statistics
• • since 2013 until today
• External lector at the Alpen Adria University, Klagenfurt, Austria
• • since 2010 until today
• Infineon Technologies Austria AG:
• • Statistician: since 2010 until today
• • Quality Manager: 2003 - 2010
• Flextronics AG
• • Quality at Design: 1998 - 2003

Education:

• Dr. rer. nat., statistics (2009)
• • Alpen Adria Universität, Klagenfurt, Austria
• Technical physics (1998)
• • Technical University, Vienna, Austria
• Commercial School (1990)
• • Handelsakademie 2, Klagenfurt, Austria

Publications:

• Determining the remaining useful life of power modules, U.S. Patent 12493077B2, 2025
• A novel methodology based on long short-term memory stacked autoencoders for unsupervised detection of abnormal working conditions in semiconductor manufacturing systems. Hosseinpour F, Ahmed I, Baraldi P, Zio E, Behzad M, Lewitschnig H. Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability. 2024.
• Early Lifetime Estimation for Automotive LIDAR Using Realistic L4 Usage Profiles. Innerwinkler, P., Grubmüller, S., Lewitschnig, H., Mischinger-Rodzievicz, M., Balaji, N. In: Recent Advances in Microelectronics Reliability. Springer, 2024.
• An Artificial Intelligence-Based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry. Ahmed, I., Hosseinpour, F., Baraldi, P., Zio, E., Lewitschnig, H. In:  Recent Advances in Microelectronics Reliability. Springer, 2024.
• Quality control of lifetime drift effects. H. Lewitschnig, L. Sommeregger. Microelectronics Reliability, vol. 139, Dec. 2022.
• Monitoring Hierarchical Systems for Safety Assurance. Franz Wotawa, Horst Lewitschnig,  Intelligent Distributed Computing XIV, 2022.
• Flexible time reduction method for burn-in of high-quality products. D. Kurz, H. Lewitschnig, J. Pilz. Quality and Reliability International, 2021.
• Exact Confidence Intervals for the Hazard Rate of a Series Reliability System. P. Plum, H. Lewitschnig, J. Pilz. 2020 Annual Reliability and Maintainability Symposium (RAMS), 2020.
• Weakness Monitors for Fail-Aware Systems. W. Granig, S. Jakšić, H. Lewitschnig, C. Mateis, D. Ničković. FORMATS 2020, Vienna, Austria.
• Fractional Failures Sampling—An Alternative to Zero Failures Sampling Plans. H. Lewitschnig and A. Fanzott. IEEE Transactions on Reliability, vol. 68, issue 2, June 2019.

• An overview on recent advances in statistical burn-in modeling for semiconductor devices. Kurz, D., Lewitschnig, H., & Pilz, J., in: Springer Proceedings in Mathematics & Statistics: Statistics and Simulation - IWS 8, Vienna, Austria; 2018

• Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak, in: Quality and Reliability Engineering International, Volume 33, Issue 8, Dec. 2017

• Failure probability estimation under additional subsystem information with application to semiconductor burn-in. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Journal of Applied Statistics, Volume 44, Issue 6, 2017.
• Failure probability estimation with differently sized reference products for semiconductor burn-in studies. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Applied Stochastic Models in Business and Industry, Volume 31, Issue 5, Sept./Oct. 2015.
• Advances on the Stress Interaction Model. Horst Lewitschnig, in: IEEE Transactions on Reliability, vol. 64, no. 1, March 2015.
• An advanced area scaling approach for semiconductor burn-in. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Microelectronics Reliability, Feb. 2014.
• Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: IEEE Transcations on Reliablity, vol. 63, no. 2, June 2014.
• Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Quality and Reliability Engineering International, Volume 30, Issue 3, April 2014.
• Co-author of AEC-Q002 Rev. B - Guidelines for Statistical Yield Analysis, Automotive Electronic Council, 12.01.2012.
• Co-author of AEC-Q001 Rev. D - Guidelines for Part Average Testing, Automotive Electronic Council, 09.12.2011.
• Quality Assurance in Automotive Electronics. V. Müller, H. Lewitschnig, N. Kortik, W. Kanert, in: e&i - elektronik und informationstechnik, Heft 10.2011.