My professional path:

• Engineering office for technical mathematics - statistics
• • since 2013 until today
• External lector at the Alpen Adria University, Klagenfurt, Austria
• • since 2010 until today
• Statistician at Infineon Technologies Austria AG:
• • since 2010 until today
• Quality manager at Infineon Technologies Austria AG:
• • 2003 - 2010
• Quality Engineer / Lead Engineer at Flextronics AG
• • 1998 - 2001: Althofen, Austria;
  • 2002 - 2003: Barcelona, Spain.

My educational path:

• Dr. rer. nat., statistics (2009)
• • Alpen Adria Universität, Klagenfurt, Austria
• Technical physics (1998)
• • Technical University, Vienna, Austria
• Commercial School (1990)
• • Handelsakademie 2, Klagenfurt, Austria

My publications:

• Quality control of lifetime drift effects. H. Lewitschnig, L. Sommeregger. Microelectronics Reliability, vol. 139, Dec. 2022.
• Monitoring Hierarchical Systems for Safety Assurance. Franz Wotawa, Horst Lewitschnig,  Intelligent Distributed Computing XIV, 2022.
• Flexible time reduction method for burn-in of high-quality products. D. Kurz, H. Lewitschnig, J. Pilz. Quality and Reliability International, 2021.
• Exact Confidence Intervals for the Hazard Rate of a Series Reliability System. P. Plum, H. Lewitschnig, J. Pilz. 2020 Annual Reliability and Maintainability Symposium (RAMS), 2020.
• Weakness Monitors for Fail-Aware Systems. W. Granig, S. Jakšić, H. Lewitschnig, C. Mateis, D. Ničković. FORMATS 2020, Vienna, Austria.
• Fractional Failures Sampling—An Alternative to Zero Failures Sampling Plans. H. Lewitschnig and A. Fanzott. IEEE Transactions on Reliability, vol. 68, issue 2, June 2019.

• An overview on recent advances in statistical burn-in modeling for semiconductor devices. Kurz, D., Lewitschnig, H., & Pilz, J., in: Springer Proceedings in Mathematics & Statistics: Statistics and Simulation - IWS 8, Vienna, Austria; 2018

• Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak, in: Quality and Reliability Engineering International, Volume 33, Issue 8, Dec. 2017

• Failure probability estimation under additional subsystem information with application to semiconductor burn-in. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Journal of Applied Statistics, Volume 44, Issue 6, 2017.
• Failure probability estimation with differently sized reference products for semiconductor burn-in studies. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Applied Stochastic Models in Business and Industry, Volume 31, Issue 5, Sept./Oct. 2015.
• Advances on the Stress Interaction Model. Horst Lewitschnig, in: IEEE Transactions on Reliability, vol. 64, no. 1, March 2015.
• An advanced area scaling approach for semiconductor burn-in. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Microelectronics Reliability, Feb. 2014.
• Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: IEEE Transcations on Reliablity, vol. 63, no. 2, June 2014.
• Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. Daniel Kurz, Horst Lewitschnig, Jürgen Pilz, in: Quality and Reliability Engineering International, Volume 30, Issue 3, April 2014.
• Co-author of AEC-Q002 Rev. B - Guidelines for Statistical Yield Analysis, Automotive Electronic Council, 12.01.2012.
• Co-author of AEC-Q001 Rev. D - Guidelines for Part Average Testing, Automotive Electronic Council, 09.12.2011.
• Quality Assurance in Automotive Electronics. V. Müller, H. Lewitschnig, N. Kortik, W. Kanert, in: e&i - elektronik und informationstechnik, Heft 10.2011.